Parcourir 2013 fascicula9 nr3 par sujet "diffractometer analysis"

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    • Characterization of Sintered Hardmetals Coated with Tic 

      Constantinescu, Stela; Orac, Lucica (Universitatea "Dunărea de Jos" din Galaţi, 2013)
      This paper presents the realization of TiC thin films by CVD method. The thin layers of TiC thicknesses were 8 and 10μm, their thickness increasing with time, keeping the temperature. Diffractometer analysis certifies ...